| Main Title |
Advances in x-ray analysis proceedings of the 55th Annual Conference on Applications of X-ray Analysis (Denver X-ray Conference), 7-11 August 2006, Denver, Colorado, U.S.A. [electronic resource] : |
| Publisher |
International Centre for Diffraction Data, |
| Year Published |
2007 |
| OCLC Number |
192029388 |
| Subjects |
X-rays--Industrial applications--Congresses
|
| Holdings |
| Library |
Call Number |
Additional Info |
Location |
Last
Modified |
Checkout
Status |
| ELBM |
TA406.5.A24 2007 v.50 |
|
AWBERC Library/Cincinnati,OH |
04/22/2013 |
|
| Collation |
1 CD-ROM : col. ; 4 3/4 in. |
| Notes |
Title from title screen. |
