| Main Title |
The physics of interface interactions related to reliability of future electronics devices. |
| Other Authors |
|
| Publisher |
Defense Technical Information Center., |
| Year Published |
1974 |
| Report Number |
AD-A001 977; AFCRL-TR-74-0263; F19628-73-C-0006 |
| OCLC Number |
905969651 |
| Holdings |
| Library |
Call Number |
Additional Info |
Location |
Last
Modified |
Checkout
Status |
| EKBD |
AD-A001 977 |
Microfiche collection |
Research Triangle Park Library/RTP, NC |
04/06/2015 |
|
| Collation |
94 pages |
| Notes |
See also AD-781 820. "AD-A001 977." "AFCRL-TR-74-0263." "F19628-73-C-0006." Microfiche. |
| Contents Notes |
;Contents: The reliability of semiconductor-insulator interfaces--Photon induced dielectric breakdown in SiO2, and Photon assisted tunneling in internal photoemission I. theory; Band structure and switching in metal oxide insulators--Electronic contact barriers and morphology of Nb2O5 thin films, and Electronic structure of the SiO2:Si3N4 interface; Instabilities associated with metal-glass interaction--Surface reactions on MOS structures, Densification of SiO2 by exposure to an ion beam, and Epitaxial growth of Nickel Silicide NiSi2 on Silicon. |
