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Main Title Trace characterization, chemical and physical /
Author Meinke, W. Wayne ; Scribner, Bourdon Francis
Other Authors
Author Title of a Work
Meinke, W. Wayne,
Scribner, Bourdon F.
CORP Author United States. National Bureau of Standards. Institute for Materials Research.
Publisher Dept. of Commerce, National Bureau of Standards,
Year Published 1967
OCLC Number 00425883
Subjects Analytical chemistry--Congresses ; Chimie ; Congrès ; Chimie analytique
Additional Subjects Chemistry, Analytic--Congresses
Library Call Number Additional Info Location Last
EKBM  QC100.U556 no.100 Research Triangle Park Library/RTP, NC 01/01/1988
Collation xiii, 580 pages : illustrations ; 25 cm.
"Based on lectures and discussions of the 1st Materials Research Symposium held at the NBS, Gaithersburg, Maryland, October 3-7, 1966." Includes bibliographical references.
Contents Notes
Trace characterization and the properties of materials / Hannay, N.B. -- Electrical measurements for trace characterization / Weisberg, L.R. -- Trace characterization by electrochemical methods / Laitinen, H.A. -- Optical and x-ray spectroscopy / Addink, N.W.H. -- Effects of trace impurities on x-ray diffraction / Chikawa, J, and Newkirk, J.B. -- Chemical spectrophotometry in trace characterization / West, T.S. -- Radioactivity techniques in trace characterization / Smales, A.A. -- Spark source mass spectrometric analysis of solids / Ahearn, A.J. -- Preconcentration in trace analysis / Minczewski, J. -- The study of crystal imperfections by means of optical methods and by means of electron microscopy and electron diffraction / Amelinckx, S.