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Main Title Imaging mass spectrometry of particulate-associated polynuclear aromatic hydrocarbons /
Author Holland, M. J. ; Linton, R. W. ; Steger, J. L. ; Merrill, R. G. ; Strossman, G. S.
Other Authors
Author Title of a Work
Linton, R. W.
Steger, J. L.
Merrill, R. G.
Strossman, G.S.
CORP Author North Carolina Univ. at Chapel Hill. Dept. of Chemistry. ;Radian Corp., Research Triangle Park, NC. ;Evans (Charles) and Associates, Redwood City, CA.;Environmental Protection Agency, Research Triangle Park, NC. National Exposure Research Lab.
Publisher U.S. Environmental Protection Agency, National Exposure Research Laboratory,
Year Published 1996
Report Number EPA/600/A-96/007; EPA-68-D4-0022; EPA/600/A-96/087
Stock Number PB97-122758
Additional Subjects Spectrometry ; Polynuclear aromatic hydrocarbons ; Particulates ; Ion spectra ; Flyash ; Diesel soot ; Particle analysis ; Spiking ; Chemical analysis ; TOF-SIMS
Internet Access
Description Access URL
Library Call Number Additional Info Location Last
NTIS  PB97-122758 Some EPA libraries have a fiche copy filed under the call number shown. 07/26/2022
Collation 10 pages ; 28 cm
Time-of-Flight secondary ion mass spectrometry (TOF-SIMS) was employed for the in situ investigation of PAHs on individual environmental particulates. TOF-SIMS is a microprobe mass spectrometry technique capable of providing surface elemental and chemical information with lateral spatial resolution less than 1 um. TOF-SIMS analysis allows for the correlation of microscopic characteristics of different particulate, filter, and sorbent substrates with adsorbed species. Silver membrane and glass fiber filters loaded with coal flyash or silica gel were placed in a method 0010 spiking train and exposed to vapor phase benzo(a)anthracene, benzo(g,h,i)perylene or pyrene. TOF-SIMS allowed surface chemical analysis of single particles on Ag filter media taken directly from the Method 0010 sampling train, wthout additional sample preparation. Seconary ion images indicated that benzo(a)anthracene is found primarily on the filter media and not on the flyash surfaces, and is of interest with respect to the elucidation of sampling artifacts. Particulate matter was also transferred to silicon wafers where native levels of diesel soot POM were imaged using TOF-SIMS.
"November 1996." Microfiche.