||Empirical Background Calculation Method for Multi-Channel X-ray Spectrometers.
Kellogg, R. B. ;
||Northrop Services, Inc., Research Triangle Park, NC.;Environmental Sciences Research Lab., Research Triangle Park, NC.
X ray spectrometers ;
Chemical analysis ;
Rayleigh scattering ;
Compton effect ;
Environmental surveys ;
Standard reference materials ;
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A method of background calculation has been developed which is applicable to fixed-channel wavelength-dispersive spectrometers which cannot directly measure background. The x-ray intensities from a set of high- and low-average atomic number standards are fitted against Rayleigh and Compton scatter parameters to an equation of the form: y - a (x sub 1) + b (x sub 2) + c. Y is the calculated intensity, x(1) and x(2) are Rayleigh and Compton scatter parameters, and c is a constant. Correlation coefficients greater than 0.99 and slopes of 1.00 are obtained for most elements measured. Calculated and measured backgrounds as well as concentrations are reported for selected standard reference materials.