| Main Title |
Empirical Background Calculation Method for Multi-Channel X-ray Spectrometers. |
| Author |
Kellogg, R. B. ;
|
| CORP Author |
Northrop Services, Inc., Research Triangle Park, NC.;Environmental Sciences Research Lab., Research Triangle Park, NC. |
| Year Published |
1983 |
| Report Number |
EPA-68-02-4033; EPA-600/D-84-028; |
| Stock Number |
PB84-130475 |
| Additional Subjects |
X ray spectrometers ;
Chemical analysis ;
Rayleigh scattering ;
Compton effect ;
Concentration(Composition) ;
Environmental surveys ;
Sampling ;
Standards ;
Standard reference materials ;
Numerical solution
|
| Holdings |
| Library |
Call Number |
Additional Info |
Location |
Last
Modified |
Checkout
Status |
| NTIS |
PB84-130475 |
Some EPA libraries have a fiche copy filed under the call number shown. |
|
07/26/2022 |
|
| Collation |
19p |
| Abstract |
A method of background calculation has been developed which is applicable to fixed-channel wavelength-dispersive spectrometers which cannot directly measure background. The x-ray intensities from a set of high- and low-average atomic number standards are fitted against Rayleigh and Compton scatter parameters to an equation of the form: y - a (x sub 1) + b (x sub 2) + c. Y is the calculated intensity, x(1) and x(2) are Rayleigh and Compton scatter parameters, and c is a constant. Correlation coefficients greater than 0.99 and slopes of 1.00 are obtained for most elements measured. Calculated and measured backgrounds as well as concentrations are reported for selected standard reference materials. |
