Record Display for the EPA National Library Catalog

RECORD NUMBER: 34 OF 5254

Main Title A Fortran program for analysis of ellipsometer measurements and calculation of reflection coefficients from thin films /
Author McCrackin, F. L. ; McCrackin, Frank L.
Other Authors
Author Title of a Work
Colson, James P.,
Publisher National Bureau of Standards,
Year Published 1964
OCLC Number 09472785
Subjects Thin films--Optical properties ; FORTRAN (Computer program language) ; Solid film--Optical properties
Internet Access
Description Access URL
(paper) https://catalog.gpo.gov/fdlpdir/locate.jsp?ItemNumber=0249-A&SYS=000732608
Holdings
Library Call Number Additional Info Location Last
Modified
Checkout
Status
ELBM  QC100.U5753 no.242 AWBERC Library/Cincinnati,OH 09/22/1989
Collation ii, 42 pages : diagrams ; 26 cm.
Notes
Includes bibliographical references. Issued May 27, 1964.