In July 1997, EPA conducted a demonstration of polychlorinated biphenyl (PCB) field analytical techniques. The demonstration design was subjected to extensive review and comment by EPA's National Exposure Research Laboratory (NERL) Environmental Science Division in Las Vegas, Nevada; Oak Ridge National Laboratory (ORNL); EPA Regional Offices; The U.S. Department of Energy (DOE), and the technology developers. The field analytical technologies tested in this demonstration at ORNL were L2000 PCB/Chloride Analyzer, the PCB Immunoassay Kit, the 4100 Vapor Detector and three immunoassay kits. The D TECH Kit utilizes immunoassay to detect trace amounts of PCB's determined as interval threshold values. The demonstration found that the D TECH kit was simple to operate in the field, requiring just one hour for initial setup and preparation for sample analysis. Once operational, The D TECH kit delivered a sample throughput of 11 samples/hour under chamber conditions and 15 samples/hour under outdoor conditions. Three operators analyzed samples during the demonstration, but the technology can be run by a single operator. Minimal training is required to operate the D TECH kit if the user has a fundamental understanding of chemical and field analyses. The overall performance of the D TECH test kit was characterized as biased. With approximately 50% replicate sample results reported as the same interval.

"EPA 600-R-98-112." "August 1998." Cover title. "Contract No. IAG DW89937854 with the Oak Ridge National Laboratory."--Title page verso. Bibliographical references: page 51.