TY  - THES
A1  - Laurent, J P
T1  - Modeling organic particulate matter formation.
N1  - R828208
ER  - 


TY  - THES
A1  - Schuppe, J L
T1  - Design of a life cycle inventory methodology for semiconductor manufacturing.
N1  - R828208
ER  - 


TY  - JOUR
A1  - Murphy, C F
A1  - Kenig, G A
A1  - Allen, D T
A1  - Laurent, J P
A1  - Dyer, D E
T1  - Development of parametric material, energy, and emission inventories for wafer fabrication in the semiconductor industry.
Y1  - 2003//
N1  - R828208
JF  - ENVIRONMENTAL SCIENCE & TECHNOLOGY
J1  - ENVIRON SCI TECHNOL
J2  - Enviornmenal Research
J3  - ENVIRONMENTAL SCIENCE & TECHNOLOGY
VL  - 37
IS  - 23
SP  - 5373
EP  - 5382
ER  - 


TY  - CONF
A1  - Laurent, J P
A1  - Murphy, C F
A1  - Allen, D T
A1  - Schuppe, J L
T1  - Life cycle inventory for semiconductor manufacturing.
N1  - R828208
ER  - 


TY  - CONF
A1  - Murphy, C F
T1  - Development of parametric inventories for semiconductor wafer fabrication.
N1  - R828208
ER  - 


TY  - CONF
A1  - Murphy, C F
T1  - Development of parametric inventories for semiconductor wafer fabrication.
N1  - R828208
ER  - 


TY  - CONF
A1  - Murphy, C F
A1  - Kenig, G A
A1  - Allen, D T
A1  - Laurent, J P
T1  - Life cycle inventory development for wafer fabrication in semiconductor manufacturing.
N1  - R828208
ER  - 


TY  - CONF
A1  - Murphy, C F
A1  - Laurent, J P
A1  - Allen, D T
A1  - Schuppe, J L
T1  - Life cycle inventory for semiconductor manufacturing.
N1  - R828208
ER  - 


TY  - CONF
A1  - Schuppe, J L
A1  - Murphy, C F
A1  - Allen, D T
T1  - Design of a Life cycle inventory for wafer semiconductor manufacturing.
N1  - R828208
ER  - 


TY  - CONF
A1  - Murphy, C F
A1  - Laurent, J P
A1  - Allen, D T
T1  - Life cycle inventory development for wafer fabrication in semiconductor manufacturing.
N1  - R828208
ER  -