Grantee Research Project Results
Dry Lithography: Environmentally Responsible Processes for High Resolution Pattern Transfer and Elimination of Image Collapse using Positive Tone Resists
EPA Grant Number: R829586Title: Dry Lithography: Environmentally Responsible Processes for High Resolution Pattern Transfer and Elimination of Image Collapse using Positive Tone Resists
Investigators: DeSimone, Joseph M.
Institution: University of North Carolina at Chapel Hill
EPA Project Officer: Richards, April
Project Period: November 1, 2001 through November 1, 2004
Project Amount: $347,898
RFA: Technology for a Sustainable Environment (2001) RFA Text | Recipients Lists
Research Category: Nanotechnology , Pollution Prevention/Sustainable Development , Sustainable and Healthy Communities
Description:
With the award of the NSF Science and Technology Center for Environmentally Responsible Processes and Solvents in 1999 (http://www.nsfstc.unc.edu

The focus of this proposed research is to utilize liquid and supercritical carbon dioxide to integrate the film deposition and removal processes in positive tone lithography with the chemistry to totally eliminate the use of solvents and water. This integrated approach based on CO2 will convert lithography from an inherently "wet" process to a "dry" process. Such a dry process would also eliminate image collapse, enable the "solvent free" coating of large area wafers, eliminate ion contamination associated with water usage during development, and ultimately allow lithographic processes to be designed for the first time into cluster tool approaches.
Approach:
The research includes environmentally friendly synthesis of advanced photoresists, the in situ and ex situ characterization of the photoresist film formation process, the physical and chemical characterization of the resists relative to processing in CO2, and the physical and chemical characterization of the resists relative to resist performance. Emphasis is on 193 and 157 nm resists.Expected Results:
Much of what is learned about environmentally friendly synthesis, pattern development avoiding collapse, and in situ and ex situ process characterization will be useable for associated patterning technologies while substantially and specifically advancing the practice of 157 nm lithography. The team of researchers for this proposal is a multi-institutional, multi-disciplinary team of scientists and engineers that are qualified to provide sufficient process information to the microelectronics and photonics industry for the rapid implementation of the CO2 based process for advanced technologies.Publications and Presentations:
Publications have been submitted on this project: View all 22 publications for this projectSupplemental Keywords:
photoacid generators, fluoropolymers, spin coating., Sustainable Industry/Business, RFA, Scientific Discipline, Technology for Sustainable Environment, Chemical Engineering, Sustainable Environment, Environmental Chemistry, Economics and Business, cleaner production/pollution prevention, Environmental Engineering, microelectronics, high resolution pattern transfer, pollution prevention, green design, supercritical carbon dioxide, supercritical carbon dioxide (SCCO2) technology, environmentally benign alternative, dry lithography, in-process waste minimization, alternative materials, cleaner production, environmentally conscious design, clean technologies, environmentally benign solvents, engineering, green chemistry, solvent substituteProgress and Final Reports:
The perspectives, information and conclusions conveyed in research project abstracts, progress reports, final reports, journal abstracts and journal publications convey the viewpoints of the principal investigator and may not represent the views and policies of ORD and EPA. Conclusions drawn by the principal investigators have not been reviewed by the Agency.