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SCANNING ELECTRON MICROSCOPY/X-RAY FLUORESCENCE CHARACTERIZATION OF POST-ABATEMENT DUST
Citation:
Mamne, Y., R. Willis, R. Stevens, AND J. Miller. SCANNING ELECTRON MICROSCOPY/X-RAY FLUORESCENCE CHARACTERIZATION OF POST-ABATEMENT DUST. U.S. Environmental Protection Agency, Washington, D.C., EPA/600/A-93/201.
Description:
Scanning electron microscopy (SEM) and laboratory X-ray fluorescence (XRF) were used to characterize post-abatement dust collected with a HEPA filtered vacuum. hree size fractions of resuspended dust (0-30 pm, 2.5-15 pm, and <2.5 pm) were collected on teflon filters and analyzed by energy-dispersive XRF. utomated SEM was used to determine the size, morphology, and chemistry of individual particles from 0.2 pm to greater than 250 pm. inerals associated with construction materials, paint fillers, and soil were the dominant species in all size fractions. ead-rich particles were found in all sizes and could be grouped into three categories: lead-only (including lead oxide and lead carbonate), mixed lead/minerals, and automotive lead. solated lead oxide or lead carbonate particles derived from paint pigments were the dominant form of the lead-bearing particles in the size fraction <15 um.