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Zeiss ΣIGMA VP-FE-SEM User Guide
Citation:
Hilgar, J. AND D. Usi. Zeiss ΣIGMA VP-FE-SEM User Guide. U.S. Environmental Protection Agency, Washington, DC, EPA/600/R-14/211, 2014.
Impact/Purpose:
Given that user accounts are customizable, and that user actions are logged, it is important that operators log off their account or close the SmartSEM software when they are finished with their session. A usage log should be kept near the instrument and be updated with information detailing the session time and general activities conducted during each user’s session with the microscope.
Description:
User guide for analyzing carbon based nanomaterials on a Zeiss Sigma microscope. The guide includes helpful steps for sample preparation and loading. Specific topics utilizing the scanning electron microscope are instrumentation startup and imagining. A variety of detectors including Television (TV) mode, Secondary Electron (SE2) and Scanning Transmission Electron Microscopy (STEM) are highlighted. Navigation, stage control, scan speed, noise reduction, brightness/contrast, magnification, focus as well as stigmation and focus wobble are discussed.