Science Inventory

DETERMINATION OF THE VAPOR PRESSURES OF SELECT POLYCHLORINATED DIBENZO-P-DIOXINS AND DIBENZOFURANS AT 75–275°C

Citation:

Ryan*, S, B K. Gullett*, D. G. TABOR*, L Oudejans, AND A. Touati. DETERMINATION OF THE VAPOR PRESSURES OF SELECT POLYCHLORINATED DIBENZO-P-DIOXINS AND DIBENZOFURANS AT 75–275°C. CHEMICAL ENGINEERING SCIENCE. Elsevier Science Ltd, New York, NY, 60(3):787-796, (2005).

Description:

Vapor pressures were determined for several polychlorinated dibenzo-p-dioxins (PCDDs) and polychlorinated dibenzofurans (PCDFs) at 75–275°C, extending the available literature data to more relevant temperature regions and providing the first experimental data for 2,3,7-trichlorodibenzo-p-dioxin (2,3,7-TriCD). A modification of the effusion technique, based upon controlling the diffusion of the target compound and subsequent high resolution gas chromatography/low resolution mass spectrometry (HRGC/LRMS) analysis, was proven comparable to other accepted methods for determining the vapor pressures of semi-volatile organic compounds (SVOCs). Vapor pressures for octachlorodibenzo-p-dioxin (OCDD) and octachlorodibenzofuran (OCDF) were in excellent agreement with those reported in literature. The application of the current method for the vapor pressure determinations of eight polychlorinated dibenzo-p-dioxins/dibenzofurans (PCDDs/PCDFs) in the extended temperature range (up to 275°C) is reported. The extension of the vapor pressures to such temperatures, unprecedented for the PCDDs/Fs, is important for vapor-particle partitioning modeling in regions relevant to PCDD/F formation and control. Estimates for the melting temperatures and enthalpies of sublimation and vaporization are also reported, the latter for which no experimentally determined values have been found in the literature. The use of the method to deliver reproducible, trace concentrations (ppt-ppb) of targets was applied to the calibration of the jet-REMPI/TOFMS as an online detector for low chlorinated PCDDs/Fs.

Record Details:

Record Type:DOCUMENT( JOURNAL/ PEER REVIEWED JOURNAL)
Product Published Date:02/01/2005
Record Last Revised:12/22/2005
Record ID: 104790