OLS : Record


Main Title Rietveld made easy : {a practical guide to the understanding of the method and successful phase quantifications} /
Author Taylor, J. C.
Publisher Sietronics Pty Ltd.,
Place Published {Canberra, Australia :
Year Published 2003
OCLC Number 57192658
Subject Added Ent Cement--Analysis; Crystallography; Rietveld method; X-rays--Diffraction
Library   Call Number Additional Info Location Date Modified
EOBM QD945.T38 2003 NEIC Library/Denver,CO 02/23/2007
Collation ix, 201 p. : ill. ; 30 cm.
Notes Cover title. First printing October 2001; second printing (with minor corrections and dedication), June 2003. Includes bibliographical references.
Contents Notes The XRD powder method -- X-ray diffraction by crystals-- three basic principles -- Some introductory crystallography -- More elementary X-ray diffraction -- X-ray scattering by atoms -- The crystal as a diffraction grating -- Some simple crystal structures -- Calculation of intensities of diffraction peaks-- the crystal "structure factor" -- Worked examples -- Collection of X-ray patterns -- Phase quantification of a two-phase mixture using the integrated intensity ratio for two nearby lines, one from each phase -- Production of X-rays in an X-ray tube -- X-ray absorption by materials --Choice of radiation for X-ray diffraction studies -- Absorption in X-ray tube windows -- Four important sources of aberration in XRD instensities -- The full integrated intensity equation for XRD powder diffraction -- References-- Rietveld made easy, part I -- Rietveld analysis, a general discussion -- Rietveld refinement strategy -- The SIROQUANT{superscript TM} Rietveld quantitative analysis software -- Some practical problems and their solution in multiphase Rietveld phase quantification -- An example of Rietveld refinement strategy: quantification of a mixture of quartz (49.3%) and ZnO (50.7%) -- Two Rietveld refinements, illustrating the immense power of the full-profile method as compared to integrated intensity methods -- The GADDS (General Area Detector Diffraction Solution) diffractometer, and its use in Rietveld XRD quantification of unmodified rocks -- Some pitfalls in Riteveld quantification.
Author Added Ent
Hinczak, Ihor.
PUB Date Free Form c2003}
BIB Level m
ISBN 0975079808 9780975079805
OCLC Time Stamp 20070222164519
Cataloging Source OCLC/T
Language eng
Origin OCLC
Type CAT
OCLC Rec Leader 02577cam 2200313Ia 45010