||Ion Beam Etching Effects in Biological Microanalysis.
Linton, R. W.;
Farmer, M. E.;
Walker, S. R.;
Shelburne, J. D.;
||North Carolina Univ. at Chapel Hill. Dept. of Chemistry. ;Research Triangle Inst., Research Triangle Park, NC. ;Duke Univ. Medical Center, Durham, NC. Dept. of Pathology.;Health Effects Research Lab., Research Triangle Park, NC.
Secondary ion mass spectroscopy;
Ion beam sputtering etching techniques;
||Most EPA libraries have a fiche copy filed under the call number shown. Check with individual libraries about paper copy.
||Oxygen ion beam sputter etching used in SIMS has been shown to produce morphologic effects which have similarities and differences in comparison to rf plasma etching of biological specimens. Sputter yield variations resulting from structural microheterogeneity are illustrated (e.g. etch-resistant nucleoli in preferentially etched nuclei), including their impact upon ion image formation in an ion microanalyzer. These image artifacts must be evaluated before secondary ion images revealing subcellular organelles can be related quantitatively to elemental localization in cells or tissues. To minimize gross surface roughness effects such as cone formation induced by ion bombardment, ion imaging studies of thin sections using low primary ion doses are indicated.
||Prepared in cooperation with Research Triangle Inst., Research Triangle Park, NC., and Duke Univ. Medical Center, Durham, NC. Dept. of Pathology. Sponsored by Health Effects Research Lab., Research Triangle Park, NC.
||Pub. in Scanning Electron Microscopy 3, p1191-1204 1982.
|NTIS Title Notes
||Reprint: Ion Beam Etching Effects in Biological Microanalysis.
|PUB Date Free Form
||7D; 6A; 99F; 57B
||Not available NTIS